February 15-17, 2017

The Center for Exploratory Research, Hitachi Ltd. Saitama, Japan


Two years have passed since the 1.2 MV holography electron microscope was developed by the FIRST Tonomura program; supported by the Japanese government. The microscope, which had achieved the world’s highest resolution of 43 pm for a W(633) lattice through an aberration corrector, has been completed, and its performance for observing electro-magnetic fields has improved. We believe that it is time to open the door on the next generation of electron phase microscopy.

The Electron Holography Workshop 2017 will be held at the Center for Exploratory Research, Hitachi Ltd. from February 15 through 17, 2017 and is supported by the Ministry of Education、Culture、Sports、Science and Technology. The purpose of this international workshop is to discuss the recent progress of electron phase microscopy and its applications to materials science. We also hope to discuss how the 1.2 MV holography electron microscope can contribute to the research of this field. This workshop will be held by the Electromagnetic Field Analysis Sharing Platform*, which consists of four organizations (Hitachi, Ltd., Japan Fine Ceramics Center, Kyushu University, and Tohoku University).

A special keynote lecture by Prof. Sumio Iijima of Meijo University, who is one of the world’s most famous scientists as the discoverer of carbon nano-tubes, is planned for the middle of the workshop. Other plenary speakers, including Prof. Rafal E. Dunin-Borkowski of Jülich Research Center, Prof. Yimei Zhu of Brookhaven National Laboratory, Prof. Etienne Snoeck of Centre d’Élaboration de Matériaux et d’Etudes Structurales, and Prof. Martha McCartney of Arizona State University, will open each session with talks, and invited speakers from around the world will join us and discuss front-line topics in the field.

 We believe that the workshop will give you a great opportunity to learn about the advances in phase microscopy and its technologies, and we are including a laboratory tour of the 1.2 MV holography electron microscope facilities. We would appreciate it if you would participate in the workshop and join us to discuss and advance the field.

*The Electromagnetic Field Analysis Sharing Platform provides opportunities for using electron holography based on electron phase measurement discussed in this workshop. Through the measurement of field distribution from micrometer to atomic scale, we can contribute to solving problems of the field from practical materials development to fundamental physics.

Sponsored by

  • Ministry of Education,Culture, Sports, Science and Technology

Organized by

  • Hitachi, Ltd.,
  • Japan Fine Ceramics Center
  • Kyushu University
  • Tohoku University

Supported by

  • The Japanese Society of Microscopy
  • RIKEN Center for Emergent Matter Science (CEMS)